Publications of G. Berthomieu

@ARTICLE{RFPT_SBH_11,
	author = { Ben Hadj, S. and Chatelain, F. and Descombes, X. and Zerubia, J. },
	title = { Approche non supervisée par processus ponctuels marqués pour l'extraction d'objets à partir d'images aériennes et satellitaires },
	year = { 2011 },
	journal = { Revue Française de Photogrammétrie et de Télédétection (SFPT) },
	number = { 194 },
	pages = { 2-15 },
	url = { http://hal.inria.fr/hal-00638665 },
	keyword = { processus ponctuel marqué, RJMCMC, Simulated Annealing, SEM, pseudo-vraisemblance, extraction d'objet. }
 }

@INPROCEEDINGS{ChatelainEMMCVPR09,
	author = { Chatelain, F. and Descombes, X. and Zerubia, J. },
	title = { Parameter estimation for marked point processes. Application to object extraction from remote sensing images. (poster) },
	year = { 2009 },
	month = { August },
	booktitle = { Proc. Energy Minimization Methods in Computer Vision and Pattern Recognition (EMMCVPR) },
	address = { Bonn, Germany },
	url = { http://link.springer.com/chapter/10.1007%2F978-3-642-03641-5_17 }
 }

@INPROCEEDINGS{cha09a,
	author = { Chatelain, F. and Descombes, X. and Zerubia, J. },
	title = { Estimation des paramètres de processus ponctuels  marqués dans le cadre de l'extraction d’objets en imagerie de télédétection },
	year = { 2009 },
	month = { November },
	booktitle = { Proc. Symposium on Signal and Image Processing (GRETSI) },
	address = { Dijon, France },
	url = { http://hal.inria.fr/inria-00399258/fr/ }
 }

@INPROCEEDINGS{sbenhadj10a,
	author = { Ben Hadj, S. and Chatelain, F. and Descombes, X. and Zerubia, J. },
	title = { Parameter estimation for a marked point process within a framework of multidimensional shape extraction from remote sensing images },
	year = { 2010 },
	month = { September },
	booktitle = { Proc. ISPRS Technical Commission III Symposium on Photogrammetry Computer Vision and Image Analysis (PCV) },
	address = { Paris, France },
	url = { http://hal.archives-ouvertes.fr/docs/00/52/63/45/PDF/ISPRS_SBH_FC_XD_JZ_Final2.pdf },
	keyword = { Shape extraction, Marked point process, RJMCMC, Simulated Annealing, Stochastic EM (SEM) }
 }

@TECHREPORT{RR-7350,
	author = { Ben Hadj, S. and Chatelain, F. and Descombes, X. and Zerubia, J. },
	title = { Estimation des paramètres de modèles de processus ponctuels marqués pour l'extraction d'objets en imagerie spatiale et aérienne haute résolution  },
	year = { 2010 },
	month = { July },
	institution = { INRIA },
	type = { Rapport de recherche },
	number = { 7350 },
	url = { http://hal.archives-ouvertes.fr/inria-00508431/fr/ },
	keyword = { Marked point process, RJMCMC, Simulated Annealing, Stochastic EM (SEM), pseudo-vraisemblance, Object extraction }
 }

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