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Publications of F. Chatelain
Result of the query in the list of publications :
Article |
1 - Approche non supervisée par processus ponctuels marqués pour l'extraction d'objets à partir d'images aériennes et satellitaires.
S. Ben Hadj and F. Chatelain and X. Descombes and J. Zerubia. Revue Française de Photogrammétrie et de Télédétection (SFPT), (194): pages 2-15, 2011.
Keywords : processus ponctuel marqué, RJMCMC, Simulated Annealing, SEM, pseudo-vraisemblance, extraction d'objet..
@ARTICLE{RFPT_SBH_11,
|
| author |
= |
{Ben Hadj, S. and Chatelain, F. and Descombes, X. and Zerubia, J.}, |
| title |
= |
{Approche non supervisée par processus ponctuels marqués pour l'extraction d'objets à partir d'images aériennes et satellitaires}, |
| year |
= |
{2011}, |
| journal |
= |
{Revue Française de Photogrammétrie et de Télédétection (SFPT)}, |
| number |
= |
{194}, |
| pages |
= |
{2-15}, |
| url |
= |
{http://hal.inria.fr/hal-00638665}, |
| keyword |
= |
{processus ponctuel marqué, RJMCMC, Simulated Annealing, SEM, pseudo-vraisemblance, extraction d'objet.} |
| } |
|
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3 Conference articles |
1 - Parameter estimation for a marked point process within a framework of multidimensional shape extraction from remote sensing images.
S. Ben Hadj and F. Chatelain and X. Descombes and J. Zerubia. In Proc. ISPRS Technical Commission III Symposium on Photogrammetry Computer Vision and Image Analysis (PCV), Paris, France, September 2010.
Keywords : Shape extraction, Marked point process, RJMCMC, Simulated Annealing, Stochastic EM (SEM).
@INPROCEEDINGS{sbenhadj10a,
|
| author |
= |
{Ben Hadj, S. and Chatelain, F. and Descombes, X. and Zerubia, J.}, |
| title |
= |
{Parameter estimation for a marked point process within a framework of multidimensional shape extraction from remote sensing images}, |
| year |
= |
{2010}, |
| month |
= |
{September}, |
| booktitle |
= |
{Proc. ISPRS Technical Commission III Symposium on Photogrammetry Computer Vision and Image Analysis (PCV)}, |
| address |
= |
{Paris, France}, |
| url |
= |
{http://hal.archives-ouvertes.fr/docs/00/52/63/45/PDF/ISPRS_SBH_FC_XD_JZ_Final2.pdf}, |
| keyword |
= |
{Shape extraction, Marked point process, RJMCMC, Simulated Annealing, Stochastic EM (SEM)} |
| } |
|
2 - Estimation des paramètres de processus ponctuels marqués dans le cadre de l'extraction d’objets en imagerie de télédétection.
F. Chatelain and X. Descombes and J. Zerubia. In Proc. Symposium on Signal and Image Processing (GRETSI), Dijon, France, November 2009.
@INPROCEEDINGS{cha09a,
|
| author |
= |
{Chatelain, F. and Descombes, X. and Zerubia, J.}, |
| title |
= |
{Estimation des paramètres de processus ponctuels marqués dans le cadre de l'extraction d’objets en imagerie de télédétection}, |
| year |
= |
{2009}, |
| month |
= |
{November}, |
| booktitle |
= |
{Proc. Symposium on Signal and Image Processing (GRETSI)}, |
| address |
= |
{Dijon, France}, |
| url |
= |
{http://hal.inria.fr/inria-00399258/fr/}, |
| keyword |
= |
{} |
| } |
|
3 - Parameter estimation for marked point processes. Application to object extraction from remote sensing images. (poster).
F. Chatelain and X. Descombes and J. Zerubia. In Proc. Energy Minimization Methods in Computer Vision and Pattern Recognition (EMMCVPR), Bonn, Germany, August 2009.
@INPROCEEDINGS{ChatelainEMMCVPR09,
|
| author |
= |
{Chatelain, F. and Descombes, X. and Zerubia, J.}, |
| title |
= |
{Parameter estimation for marked point processes. Application to object extraction from remote sensing images. (poster)}, |
| year |
= |
{2009}, |
| month |
= |
{August}, |
| booktitle |
= |
{Proc. Energy Minimization Methods in Computer Vision and Pattern Recognition (EMMCVPR)}, |
| address |
= |
{Bonn, Germany}, |
| url |
= |
{http://link.springer.com/chapter/10.1007%2F978-3-642-03641-5_17}, |
| keyword |
= |
{} |
| } |
|
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Technical and Research Report |
1 - Estimation des paramètres de modèles de processus ponctuels marqués pour l'extraction d'objets en imagerie spatiale et aérienne haute résolution .
S. Ben Hadj and F. Chatelain and X. Descombes and J. Zerubia. Rapport de recherche 7350, INRIA, July 2010.
Keywords : Marked point process, RJMCMC, Simulated Annealing, Stochastic EM (SEM), pseudo-vraisemblance, Object extraction.
@TECHREPORT{RR-7350,
|
| author |
= |
{Ben Hadj, S. and Chatelain, F. and Descombes, X. and Zerubia, J.}, |
| title |
= |
{Estimation des paramètres de modèles de processus ponctuels marqués pour l'extraction d'objets en imagerie spatiale et aérienne haute résolution }, |
| year |
= |
{2010}, |
| month |
= |
{July}, |
| institution |
= |
{INRIA}, |
| type |
= |
{Rapport de recherche}, |
| number |
= |
{7350}, |
| url |
= |
{http://hal.archives-ouvertes.fr/inria-00508431/fr/}, |
| keyword |
= |
{Marked point process, RJMCMC, Simulated Annealing, Stochastic EM (SEM), pseudo-vraisemblance, Object extraction} |
| } |
|
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