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Publications of V. Castro-Alves
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Publications of V. Castro-Alves

Conference articles
  1. V. Castro-Alves, A. Ferreira, and O. Kebichi. A new class of fault models and test algorithms for dual-port dynamic RAM testing. In Proceedings of the IEEE International Workshop on Memory Testing, San Jose (CA), pages 68--71, August 1993. IEEE Press. [bibtex-entry]


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Last modified: Thu Oct 10 14:10:01 2013

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