Publications of O. Kebichi
BACK TO COATI PUBLICATION INDEXPublications of O. Kebichi
| Conference's articles |
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V. Castro-Alves,
A. Ferreira,
and O. Kebichi.
A new class of fault models and test algorithms for dual-port dynamic RAM testing.
In Proceedings of the IEEE International Workshop on Memory Testing,
San Jose (CA),
pages 68--71,
August 1993.
IEEE Press.
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